Non-destructive inspection method and apparatus therefor
US7462827B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2005 |
| Grant date | Dec 9, 2008 |
| Priority date | — |
| Expiry date | Nov 16, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8918
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
By using an image signal acquired by picking up a sample to be inspected by a color video camera, penetrant inspection and magnetic-particle inspection which are non-destructive inspections are carried out so that deficiency candidates including a pseudo deficiency are automatically detected and are displayed on a screen. A real deficiency can be detected from the deficiency candidates displayed on the screen. As image data is stored in memory means, information of a deficiency can be repeatedly reproduced on the screen. In the penetrant inspection, the chromaticity at each position on an image is acquired, a deficiency candidate is extracted based on the chrominance, and the deficiency is distinguished from a pseudo deficiency based on the differential value of the chrominance. A polarization filter is used to eliminate regular reflection originated from illumination in the penetrant inspection, and an ultraviolet-rays cutting filter is attached to the camera to prevent noise in the magnetic-particle inspection. Equipped with both a white illuminating lamp and an ultraviolet illuminating lamp, both inspections can be carried out with a single probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.