System and method of determining a position of a radiation scattering/reflecting element
US7465914B2 · kind B2 · utility
144Cited by
36References
42Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 9, 2004 |
| Grant date | Dec 16, 2008 |
| Priority date | — |
| Expiry date | Sep 9, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04109
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for determining the position of a radiation scattering/reflecting element, where the radiation emitter is provided at a surface of a radiation transmissive element an on which radiation is incident. This incident radiation is scattered/diffused/reflected by the scattering/reflecting element and guided by the transmissive element toward a detector able to determine the position of the element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.