Patent · US Active

Test head docking system and method

US7466122B2 · kind B2 · utility

0Cited by

23References

7Claims

0Family size

Assignee

inTEST IP Corporation · US

Inventors

Naum Gudin · Cherry Hill, US
Christopher L. West · Medford, US
I. Marvin Weilerstein · Abington, US
Nils. O. Ny · Yardley, US
Alyn R. Holt · Cherry Hill, US

Key dates

Filing date	Aug 11, 2006
Grant date	Dec 16, 2008
Priority date	—
Expiry date	Dec 3, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2851
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.