Sensor system for measuring an electric potential signal of an object
US7466148B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2005 |
| Grant date | Dec 16, 2008 |
| Priority date | — |
| Expiry date | Feb 25, 2026 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/308
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The invention generally pertains to reducing artifact noise signals present when non-invasive capacitive-type signal measurements are taken of static electric fields produced by an object of interest. According to a first preferred embodiment of the invention, a given static artifact signal is reduced by minimizing the potential difference between a ground point of sensor circuitry and the potential of the object. According to a second preferred embodiment of the invention, the change in signal due to motion of the sensor in the field produced by the object is minimized by reducing the impact of changes in coupling to the signal source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.