Integrated circuit, self-test method for the integrated circuit, and optical disc apparatus including the integrated circuit
US7466253B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 30, 2007 |
| Grant date | Dec 16, 2008 |
| Priority date | — |
| Expiry date | Jul 30, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1071
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An integrated circuit includes an AD converter and a self-test circuit configured to test the AD converter. The self-test circuit includes a clock generator which generates a clock for allowing the AD converter to AD-convert an external sine wave signal externally input, a sine wave generator which generates an internal sine wave signal in digital form, a subtractor which determines a differential signal between the AD-converted external sine wave signal and the internal sine wave signal, a PLL device which allows a phase-locked loop receiving the differential signal as an input to control a phase of the internal sine wave signal such that the internal sine wave signal is in phase with the external sine wave signal, and a root mean square calculator which calculates a root mean square of the differential signal to generate a diagnostic signal corresponding to the AD converter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.