Analyte detection using nanowires produced by on-wire lithography
US7466406B2 · kind B2 · utility
3Cited by
1References
15Claims
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Key dates
| Filing date | Mar 10, 2006 |
| Grant date | Dec 16, 2008 |
| Priority date | — |
| Expiry date | Apr 7, 2027 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/762
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to methods of detecting analytes using nanowires having nanodisk arrays. In particular, the present invention discloses methods of detecting analytes via surface enhanced Raman scattering (SERS) and employing nanowires prepared using on-wire lithography (OWL).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.