Condenser zone plate illumination for point X-ray sources
US7466796B2 · kind B2 · utility
2Cited by
37References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 5, 2005 |
| Grant date | Dec 16, 2008 |
| Priority date | — |
| Expiry date | Dec 6, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K7/00
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
An improved short-wavelength microscope is described in which a specimen sample is placed between a condenser zone plate lens and an objective zone plate lens so that the specimen is aligned with a diffraction order of the condenser zone plate lens that is greater than one and proximal to the condenser zone plate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.