Patent · US Active

Method for analyzing and representing x-ray projection images and x-ray examination unit

US7469034B2 · kind B2 · utility

1Cited by

12References

14Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Philipp Bernhardt · Forchheim, DE
Friedrich Koch
Martin Kolarjk · Koblenzer Straße, DE
Ernst-Peter Rührnschopf · Erlangen, DE
Helmuth Schramm · Neunkirchen, DE

Key dates

Filing date	Apr 21, 2006
Grant date	Dec 23, 2008
Priority date	—
Expiry date	Jul 13, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG06T11/005
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The invention relates to a method and an x-ray examination unit for analyzing and representing x-ray projection images with an x-ray examination unit, where the function relation bU=ƒU−1(J˜/J0) is established between the attenuation value and a material-equivalent value as a function of the energy spectrum used, and for the purposes of projection representation, the magnitude of the material-equivalent value bU of a specific material is represented as an image value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.