Monitoring detection and removal of malfunctioning devices from an arbitrated loop
US7469361B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 4, 2005 |
| Grant date | Dec 23, 2008 |
| Priority date | — |
| Expiry date | Jan 21, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L69/40
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
The detection, removal and reinsertion of possibly malfunctioning devices from an arbitrated loop is disclosed. When a new device is first connected to a storage switch and a loop is formed and begins initialization, a LOOP_DOWN event is sent to a processor and a loop down timer is started for each port in the loop. If initialization is successful, a LOOP_UP event is sent to the processor and the loop down timer is reset for each port in the loop. However, if one of the loop down timers times out, a problem occurred during the initialization. The port associated with the timed out timer is bypassed so that the devices in the remainder of the loop can continue trying to complete the initialization. The processor initiates a PTBI event on the bypassed device. If the bypassed device is operating properly, it is re-inserted back into the loop.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.