Integrated chip clamp adjustment assembly and method
US7470140B1 · kind B1 · utility
Inventor
Key dates
| Filing date | Jun 18, 2007 |
| Grant date | Dec 30, 2008 |
| Priority date | — |
| Expiry date | Jun 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0425
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein is an apparatus that relates to a device useful in integrated chip (IC) testing apparatus. More particularly, the device is an adjustable clamp assembly which allows a variety of different sized IC's to be used with a single piece of test equipment. The clamp assembly includes a frame, a base and a plurality of clamps. Each clamp is movably connected to the base to allow movement in the x-y directions and each of the clamps includes an z-direction adjustment mechanism. Additionally, the device according to this invention also includes an adapter having opposed adapters which are designed for compatible mating with a mechanized handlers. In an exemplary embodiment, the adapter has a suspension system designed for quiet mechanized handling of the IC while being held by the clamp assembly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.