Systems for measuring magnetostriction in magnetoresistive elements
US7471082B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 1, 2007 |
| Grant date | Dec 30, 2008 |
| Priority date | — |
| Expiry date | Oct 1, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for use when measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes a mechanism for applying a first magnetic field about parallel to a substrate having one or more magnetoresistive elements, and for applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the elements; a mechanism for applying a mechanical stress to the substrate during application of the magnetic fields; and a measuring subsystem for measuring a signal from at least one of the magnetoresistive elements, wherein the second magnetic field is a magnetic alternating field, wherein the measuring subsystem is locked to a frequency of the alternating field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.