Measuring threshold voltage of transistors in a circuit
US7471102B2 · kind B2 · utility
7Cited by
2References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2007 |
| Grant date | Dec 30, 2008 |
| Priority date | — |
| Expiry date | Mar 1, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2621
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one embodiment, the present invention includes an oscillator to generate a first frequency and a second frequency. The oscillator includes a plurality of stage cells, each stage cell including a first transistor of a first polarity and a second transistor of a second polarity, each coupled between a first voltage node and a first intermediate node and an inverter coupled to the first intermediate node. In operation, a difference between the first frequency and the second frequency is proportional to a threshold voltage of the second transistor. Other embodiments are described and claimed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.