Integrated semiconductor memory and method for operating an integrated semiconductor memory
US7471584B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 9, 2007 |
| Grant date | Dec 30, 2008 |
| Priority date | — |
| Expiry date | Jun 29, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/4061
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated semiconductor memory that has at least one temperature measuring element and repeatedly carries out a temperature measurement during the operation of the semiconductor memory, wherein the semiconductor memory repeats the temperature measurement at instants corresponding to a measuring frequency of the temperature measuring element. According to an embodiment of the invention, the measuring frequency of the temperature measuring element is variable and the temperature measuring element is driven in such a way that the measuring frequency changes in a manner dependent on the temporal development of measured values of the repeated temperature measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.