Systems and methods for estimating presence of a material within a volume of interest using x-ray
US7471768B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 7, 2006 |
| Grant date | Dec 30, 2008 |
| Priority date | — |
| Expiry date | May 12, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/402
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Certain embodiments of the present invention provide a method for x-ray imaging including: exposing a volume of interest to a first technique level to obtain a first set of image data; exposing the volume of interest to a second technique level to obtain a second set of image data; and estimating whether the volume of interest includes a foreign object based at least in part on a comparison of at least an aspect of the first set of image data and at least an aspect of the second set of image data. According to an embodiment, one of the first and second technique levels is selected to generate x-rays having a higher average energy than the other of the first and second technique levels. According to an embodiment, at least one of the first and second technique levels is selectable to cause an overexposure. According to an embodiment, at least one of the first and second technique levels corresponds to a clinical technique level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.