Measuring device and method for verifying the cut quality of a sheet using image scanning
US7473920B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 22, 2004 |
| Grant date | Jan 6, 2009 |
| Priority date | — |
| Expiry date | May 1, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G15/60
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A measuring device and measuring method are provided for testing the cut quality of a sheet. The measuring device is provided with a transparent scanning substrate for holding the sheet, a scanning device with a scanning window, and a cover for covering the sheet held by the scanning substrate, wherein the scanning window overlaps the sheet, forming edge regions, and the cover has different reflection properties from the sheet for producing a high-contrast scanned image of the sheet and of the edge regions between the sheet and the scanning window. The measuring method includes positioning the sheet on a transparent scanning substrate, covering the sheet with a cover, and scanning the sheet with a scanning device, wherein the scanning device scans in the region of a scanning window which encompasses both the sheet and edge regions surrounding the sheet, and differences in contrast between the sheet and the edge regions are detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.