Embedded time domain analyzer for high speed circuits
US7474974B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2007 |
| Grant date | Jan 6, 2009 |
| Priority date | — |
| Expiry date | Jan 31, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31726
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of providing an on-chip high-speed time domain digital analyzer for the characterization and analysis of signals within an integrated circuit is provided. The method involves processing the signal being characterized/analyzed in the digital domain irrespective of it's starting format. The approach performs a voltage-to-time conversion using predetermined voltage thresholds, applying a time amplification to the digital time information, measuring the amplified time difference between events and converting the amplified time difference as required by the characterization/analysis. The method allows the capture of very high-speed signals with high resolution without the requirements of complex and high-speed electronics. As such the on-chip high-speed time domain digital analyzer can function as an oscilloscope, pulse width analyzer, rise time analyzer and even logic analyzer. Further the method allows the capture and analysis of single and non-repetitive signal events unlike prior art approaches to time domain oscilloscopes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.