Patent · US Expired

Method of manufacture for microelectromechanical devices

US7476327B2 · kind B2 · utility

55Cited by
317References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 4, 2004
Grant dateJan 13, 2009
Priority date
Expiry dateMar 2, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/12542
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method of manufacturing a microelectromechanical device includes forming at least two conductive layers on a substrate. An isolation layer is formed between the two conductive layers. The conductive layers are electrically coupled together and then the isolation layer is removed to form a gap between the conductive layers. The electrical coupling of the layers mitigates or eliminates the effects of electrostatic charge build up on the device during the removal process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.