Addressable field enhancement microscopy
US7476787B2 · kind B2 · utility
52Cited by
4References
48Claims
0Family size
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Key dates
| Filing date | Feb 23, 2006 |
| Grant date | Jan 13, 2009 |
| Priority date | — |
| Expiry date | Apr 14, 2027 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for addressable field enhancement microscopy are provided. In an embodiment, a nanoscale array of islands may be illuminated with an electromagnetic signal and addressed to differentiate signals from different islands of the nanoscale array. The differentiated signals originating from illuminating the nanoscale array may be applied to microscopy of a specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.