Examination system and examination method
US7477764B2 · kind B2 · utility
21Cited by
7References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 12, 2003 |
| Grant date | Jan 13, 2009 |
| Priority date | — |
| Expiry date | Aug 24, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S128/922
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An examination system and a corresponding examination method, comprise: Arranging a tissue region in a vicinity of an object plane of a microscope and generating an optical image of the tissue region, receiving tissue data from a measuring head separate from the microscope, discriminating the tissue data into at least two data categories and displaying markings in the optical image of the tissue region in dependence of the discriminated data category and a relative position between a component of the microscope and the measuring head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.