Spatial transforms from displayed codes
US7477784B2 · kind B2 · utility
11Cited by
5References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 1, 2005 |
| Grant date | Jan 13, 2009 |
| Priority date | — |
| Expiry date | May 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/1423
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for performing EIC pattern analysis is described. Pattern feature extraction is performed followed by EIC symbol segmentation. A system may later use the result from the pattern analysis to determine a location of a captured image in relation to a larger array of EIC symbols.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.