Patent · US Expired

Method of assembling a diagnostic test strip having a functional overlay

US7479253B2 · kind B2 · utility

1Cited by

13References

5Claims

0Family size

Assignee

Roche Diagnostics GMBH · DE

Inventors

Wolfgang-Reinhold Knappe · Ludwigshafen, DE
Helmut Leininger · Mannheim, DE
Ralf Steinbrueck · Mannheim, DE
Franz Wittmann · Hockenheim, DE

Key dates

Filing date	Feb 7, 2003
Grant date	Jan 20, 2009
Priority date	—
Expiry date	Jan 19, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG01N33/525
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A flat-shaped functional overlay for at least one region of a flat-shaped flexible object which does not form a fold when the sandwich composed of the flexible object and overlay is bent towards the side on which the overlay is located is described. The overlay is composed of one or several flat-shaped overlays which are attached to the flexible object in such a way that a part of their surface can move freely relative to the surface of the object covered by this part in the direction of curvature produced when the object is bent.In addition diagnostic test strips are described which have such an overlay.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.