Method and apparatus for detecting current changes in integrated circuits
US7483248B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 19, 2005 |
| Grant date | Jan 27, 2009 |
| Priority date | — |
| Expiry date | Dec 1, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/16552
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One embodiment of the present invention provides a system that detects changes in power-supply current within an integrated circuit (IC) chip. During operation, the system monitors an induced current through a detection loop. This detection loop is situated at least partially within the IC chip in close proximity to a power-supply current for the IC chip, so that a change in the power-supply current changes a magnetic field passing through the detection loop, thereby inducing a corresponding current through the detection loop. The system then generates a control signal based on the induced current, so that changes in the power-supply current cause the control signal to change. In addition, the system uses the control signal to control circuits within the IC chip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.