Patent · US Active

Test rack adapter for hard disk drive

US7483269B1 · kind B1 · utility

56Cited by
17References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 2, 2006
Grant dateJan 27, 2009
Priority date
Expiry dateJan 24, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F1/187
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An adapter which allows two or more hard disk drives to conduct self-testing in a single test rack slot is provided. Testing can be individually controlled for the various HDDs in a slot. Peltier cell devices or other cooling or heating devices can be controlled to achieve individualized temperature control for HDDs in the test rack slot.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.