Patent · US Expired

Variable centre diffractometer

US7483512B2 · kind B2 · utility

1Cited by
3References
12Claims
0Family size

Inventor

Key dates

Filing dateJan 31, 2006
Grant dateJan 27, 2009
Priority date
Expiry dateJan 31, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/207
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A diffractometer, having variable center and suitable for performing analysis on hidden or hardly accessible bodies or specimens is described. Said variable center diffractometer is equipped with an analytical unit that comprises: a circle arc structure, called Euler cradle; a radiation beam source and a detector of the said radiation beam; devices for the pointing of the analytical unit; devices for the movements of said analytical unit in the space; devices for rotation of said source and detector along the Euler cradle; characterized by the fact that it comprises also: devices able to rotate said source and detector with respect to an orthogonal axis to the plane containing the Euler cradle; collimators or deflectors firmly placed on the said radiation source and detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.