Method for predicting and optimizing chip performance in cured thermoset coatings
US7485336B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 14, 2005 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Aug 1, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0647
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a method for evaluating chip performance of a cured coating system. In one embodiment, the method includes providing a coated substrate comprising a substrate and a cured film of a first coating composition thereon, measuring elastic work energy (We/Wtot) of the cured film, and calculating a % C.P. of the cured film via the formula: % C.P.=7.61636−0.225473 (We/Wtot) wherein a % C.P. of equal to or less than about 3.5% correlates to a total paint loss of equal to or less than 5% of a coating system comprising the first coating composition. The disclosed method predicts the gravelometer chip performance of a cured multilayer coating system comprising a first coating composition and a topcoat by measuring the measuring elastic work energy (We/Wtot) of the cured first coating system alone. In one embodiment, chip performance can be predicted without topcoat application and independent of topcoat composition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.