Compact systems and methods for generating a diffraction profile
US7486760B2 · kind B2 · utility
23Cited by
2References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 15, 2006 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Oct 16, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An imaging system for generating a diffraction profile is described. The imaging system includes a gantry including an x-ray imaging system configured to generate an x-ray image of a substance and a scatter system configured to generate a diffraction profile of the substance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.