Systems and methods for x-ray imaging and scanning of objects
US7486772B2 · kind B2 · utility
15Cited by
10References
48Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2006 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Nov 17, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/068
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for x-ray imaging and scanning of objects are disclosed. According to one aspect, the subject matter described herein can include providing an x-ray source configured to generate a plurality of individually-controllable x-ray beams, positioning an object to be imaged in a path for intercepting at least one of the x-ray beams, activating the x-ray source, detecting intensities of the emitted x-ray beams, and generating imaging data based on the intensities for constructing an image of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.