Method for dynamically adjusting parameter values of part heights to verify distances between parts
US7487478B2 · kind B2 · utility
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4References
5Claims
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Key dates
| Filing date | Mar 20, 2006 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Aug 18, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2115/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for dynamically adjusting parameter values of part heights to verify the distances between parts is provided. The method comprises, inputting multiple sets of limiting conditions for part heights through a setting interface; and verifying whether the parts are appropriately positioned in a circuit diagram according to the limiting conditions for part heights, thereby upgrading the quality of design of the printed circuit board and enhancing the reliability of electronic products.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.