Contaminant scanning system
US7487689B2 · kind B2 · utility
2Cited by
37References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2004 |
| Grant date | Feb 10, 2009 |
| Priority date | — |
| Expiry date | Jan 7, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A vapor collection system. The system includes one or more walls that define a chamber for receiving inspected items, at least one pipe adapted to eject a gas jet within the chamber, the gas jet being provided at an angle relative to a normal to the wall of the chamber, at the point at which the pipe enters the chamber, at least one tube adapted to remove gas samples from the chamber, and an analysis unit adapted to determine whether the gas samples include one or more particulates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.