Patent · US Expired

Method for detecting and compensating an underdosage of test strips

US7488602B2 · kind B2 · utility

2Cited by
23References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 16, 2003
Grant dateFeb 10, 2009
Priority date
Expiry dateNov 1, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/8483
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention concerns a method for detecting an underdosage of an analytical test element and optionally for compensating the underdosage. The invention also concerns an analytical system and a test element which are suitable for detecting an underdosage.An underdosage of the test element can be reliably detected and optionally calculated by irradiating the analytical test element in a control wavelength range. For this purpose the test element contains a control substance which interacts with the radiation in the control wavelength range as a function of the contact with the applied amount of sample.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.