Multiphoton-excitation observation apparatus
US7488955B2 · kind B2 · utility
3Cited by
2References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 22, 2007 |
| Grant date | Feb 10, 2009 |
| Priority date | — |
| Expiry date | Aug 3, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6458
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a multiphoton-excitation observation apparatus comprising a light-source unit for emitting pulsed laser light; an observation apparatus main unit for irradiating a specimen with laser light emitted from the light-source unit and observing fluorescence emitted from the specimen; an incidence adjusting device, disposed between the light-source unit and the observation apparatus main unit, for adjusting the beam diameter of the laser light emitted from the light-source unit; and a control apparatus for controlling the incidence-adjusting unit according to the depth of an observation plane in the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.