System for measuring the surface geometry and surface evenness of flat products

US7489820B1 · kind B1 · utility

Assignee

• VDEh-Betriebsforschungsinstitut GmbH · DE

Inventors

• Ulrich Müller · Neustadt, DE
• Detlef Winter · Wendeburg, DE
• Detlef Sonnenschein · Essen, DE
• Rudolf Stockmeyer · Langenfeld, DE
• Gustav Peuker · Rheydt, DE

Key dates

• Filing date: Sep 7, 1999
• Grant date: Feb 10, 2009
• Expiry date: Sep 7, 2019

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B11/306
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a device for producing a pattern on a surface for measuring, using a projector and a slide. The invention also relates to various advantageous embodiments of the measuring system.