Auto-calibration method for delay circuit
US7490273B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 12, 2004 |
| Grant date | Feb 10, 2009 |
| Priority date | — |
| Expiry date | Dec 20, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/00156
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An auto-calibration method is applied to a delay circuit, which includes a plurality of delay chains. If the number of accumulative errors of a designated delay chain as a current delay path is larger than a threshold value, the delay circuit scans all the delay chains and records their accumulative error numbers during a unit of time; otherwise, the current delay path is maintained. Afterwards, the number of accumulative errors is compared between all the delay chains to find out which one of the delay chains has a minimum accumulative error number, and the delay chain with a minimum accumulative error number is designated as a new current delay path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.