Contour measuring device with error correcting unit
US7490413B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 23, 2007 |
| Grant date | Feb 17, 2009 |
| Priority date | — |
| Expiry date | Sep 10, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary contour measuring device (100) includes a pair of guide rails (13), a movable fixture (14), a first probe (15), a second probe (16), and an error correcting unit (17). The movable fixture is movably disposed on the guide rails. The first probe is configured for measuring an object along a contour measuring direction and obtaining a first measured contour value from the object to be measured. The second probe is configured for measuring a standard object whose contour is known along the contour measuring direction and obtaining a second measured contour value from the standard object. The error correcting unit is configured for compensating the first measured contour value according to the second measured contour value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.