Testing apparatus for surface mounted connectors
US7492174B2 · kind B2 · utility
2Cited by
11References
12Claims
0Family size
Inventor
Key dates
| Filing date | Jun 18, 2007 |
| Grant date | Feb 17, 2009 |
| Priority date | — |
| Expiry date | Jun 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/69
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate contact with the connector to be tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.