Attenuated-total-reflection measurement apparatus
US7492460B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2006 |
| Grant date | Feb 17, 2009 |
| Priority date | — |
| Expiry date | Jul 15, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/552
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides an attenuated-total-reflection (“ATR”) measurement apparatus that collects light onto a contact surface between a sample and an ATR prism at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus according to the invention includes: a light-irradiating system for emitting the light which is collected onto the contact surface; a photodetector for detecting the total-reflection light from the contact surface; an aperture for restricting the light which the photodetector detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror provided in a light path extending from the ATR prism to the aperture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.