Method and system for measuring optical properties of scattering and absorbing materials
US7495221B2 · kind B2 · utility
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2References
27Claims
0Family size
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Key dates
| Filing date | May 15, 2007 |
| Grant date | Feb 24, 2009 |
| Priority date | — |
| Expiry date | May 31, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for determining a level of effective residual ink concentration (ERIC) in a piece of recycled paper. The piece of paper is illuminated with a beam of radiation and an amount of the beam of radiation reflected and transmitted by the piece of paper is measured. The level of ERIC is determined as a function of the reflected and transmitted radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.