Patent · US Active

Performing a signal analysis based on digital samples in conjunction with analog samples

US7495591B2 · kind B2 · utility

3Cited by

4References

11Claims

0Family size

Assignee

AGILENT TECHNOLOGIES, INC. · US

Inventors

Joachim Moll · Herrenberg, DE
Heiko Schmitt · Eppelheim, DE
Michael Fleischer-Reumann · Wildberg, DE

Key dates

Filing date	May 31, 2007
Grant date	Feb 24, 2009
Priority date	—
Expiry date	May 31, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/316
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.