Dual function measurement system
US7495763B2 · kind B2 · utility
1Cited by
11References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 11, 2006 |
| Grant date | Feb 24, 2009 |
| Priority date | — |
| Expiry date | Dec 11, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system having dual measurements capabilities is disclosed. The measurement system has a light source configured to provide light along a first axis that illuminates a sample media. The measurement system has a first sensor configured to measure scattered light in a sample media. The measurement system has a second sensor configured to measure light passing through the sample media.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.