Spectroscopic analysis technique for measuring the amount of surface material on wire
US7495766B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 22, 2006 |
| Grant date | Feb 24, 2009 |
| Priority date | — |
| Expiry date | Aug 8, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8427
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In accordance with the present application, a method and system is provided for measuring an amount of surface material on a wire. A section of the wire and a beam generating device configured to generate a high energy beam are placed in a positional relationship with each other. The relationship permits a high energy beam generated from the beam generating device to impinge upon a location on the section of the wire. A reflected beam from the high energy beam is reflected from the section of the wire and is detected by a detector positioned at a location to receive the reflected beam. The beam received by the detector is investigated to determine the characteristics of the surface material on the wire.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.