Patent · US Expired

Dynamic on-chip logic analysis

US7496474B2 · kind B2 · utility

6Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 16, 2005
Grant dateFeb 24, 2009
Priority date
Expiry dateNov 16, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3177
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and the information stored may include data, timing information, control data and other such information related to the tapped signals. The stored information may be provided to an external device for analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.