Dynamic on-chip logic analysis
US7496474B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2005 |
| Grant date | Feb 24, 2009 |
| Priority date | — |
| Expiry date | Nov 16, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3177
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and the information stored may include data, timing information, control data and other such information related to the tapped signals. The stored information may be provided to an external device for analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.