Method and system for a multiple focal spot x-ray system
US7497620B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2006 |
| Grant date | Mar 3, 2009 |
| Priority date | — |
| Expiry date | Aug 15, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A radiographic inspection system includes an electron gun, a fixed anode of a dense material, and apparatus for steering an electron beam generated by the electron gun to multiple focal spots on the anode. A detector includes a plurality of individual detector elements. Operation of the system includes is carried out by directing the electron beam at a first time interval to a first focal spot on the anode, generating a first X-ray beam aligned with a first detector element. During a second time interval, the electron beam is directed to a second focal spot on the anode, spaced-away from the first focal spot, generating a second X-ray beam aligned with a second detector element. This cycle is repeated with additional focal spots in a one-dimensional or two-dimensional pattern. The detector element output is read in coordination with the position of the electron beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.