Conduction-cooled accelerated test fixture
US7498831B2 · kind B2 · utility
0Cited by
7References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 5, 2006 |
| Grant date | Mar 3, 2009 |
| Priority date | — |
| Expiry date | Mar 15, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2817
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one embodiment of the invention, a testing apparatus for executing highly accelerated life testing on at least one test subject including at least one structure operable to thermally stress the test subject via conduction and at least one pneumatic hammer operable to input imparting vibrations to the test subject. According to another embodiment of the invention, a method for executing highly accelerated life testing of at least one test subject via conduction at a rate of change of at least 8 ° C. per minute and imparting vibrations to the test subject at a rate of at least 3Gs rms.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.