Method and program for comparing the size of a feature in sequential x-ray images
US7499579B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 3, 2004 |
| Grant date | Mar 3, 2009 |
| Priority date | — |
| Expiry date | Jul 19, 2025 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61C19/04
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method of comparing the size of a feature in sequential X-ray images includes the steps of: forming first and second sequential X-ray images including an image of the feature, an image of a first target located directly adjacent the feature and an image of a second target located between the object and an X-ray detector; calculating scale factors for the first and second X-ray images based on the relative sizes of the images of the first and second targets in the X-ray images; measuring the sizes of the feature in the first and second X-ray images; adjusting the measured sizes of the feature in the first and second X-ray images by the respective scale factors; and comparing the adjusted measured sizes. A computer program product for performing the method is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.