Patent · US Active

Position measuring arrangement and procedure for the assembly of a position measuring arrangement

US7500320B2 · kind B2 · utility

1Cited by

6References

9Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Andreas Schröter · Nürnberg, DE
Thomas Jager · Meckenbeuren, DE
Waltraud Aichhorn · Palling, DE

Key dates

Filing date	Jul 30, 2007
Grant date	Mar 10, 2009
Priority date	—
Expiry date	Jul 30, 2027

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T29/53
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for assembling a position measuring arrangement for measuring a relative position of a first object with respect to a second object, wherein the position measuring arrangement includes a first unit movable in relation to a second unit of the position measuring arrangement, the method including fastening said first unit to the first object and fastening the second unit to the second object. The method further including adjusting a required scanning distance (A) between a scanning element of the second unit and a graduation of the second unit by applying a gauge to a first limit stop face of the first unit, as well as to a second limit stop face of the second unit. Prior to the fastening the first unit and the fastening the second unit, positioning and fixing either the first limit stop face on the first unit or the second limit stop face on the second unit in a direction of the required scanning distance so that the scanning distance (A) is optimally adjusted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.