Patent · US Active

Positioning device for a test element

US7501097B2 · kind B2 · utility

0Cited by
11References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 2004
Grant dateMar 10, 2009
Priority date
Expiry dateJun 12, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2035/00039
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element. A second switch component is positioned parallel to the first switch component. A connection is established when the second switch component is positioned in recess on the test element due to the displacement of the second switch component relative to the first switch component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.