Positioning device for a test element
US7501097B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 20, 2004 |
| Grant date | Mar 10, 2009 |
| Priority date | — |
| Expiry date | Jun 12, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00039
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element. A second switch component is positioned parallel to the first switch component. A connection is established when the second switch component is positioned in recess on the test element due to the displacement of the second switch component relative to the first switch component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.