Measuring technology and computer numerical control technology
US7502125B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 24, 2004 |
| Grant date | Mar 10, 2009 |
| Priority date | — |
| Expiry date | Jan 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring apparatus of this invention comprises: a projector; a camera; a generator that generates, from a photographed image of a fringe pattern projected by the projector at a time of calibration onto each of surfaces, first tuples, each including coordinates of a point on a light receiving plane (LRP) of the camera, light intensity of the point and the height of the surface; a converter that converts the light intensity to a phase angle of the projected fringe pattern (PFP), and generates second tuples, each including the coordinates of the point on the LRP, the phase angle and the height of the surface; a hypersurface generator that generates data representing a tensor product type composite hypersurface (TPTCH) from data of the second tuples; an extractor that extracts data of third tuples, each including coordinates of a point on the LRP and light intensity from a photographed image of a fringe pattern projected by the projector at a time of measurement onto an object to be measured; a second converter that converts the light intensity to a phase angle of the PFP to generate data of fourth tuples, each including the coordinates of the point on the LRP and the phase angle; a…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.