Patent · US Active

Position indicator, measuring apparatus and method of manufacturing a position indicator

US7502280B2 · kind B2 · utility

3Cited by
8References
18Claims
0Family size

Inventor

Key dates

Filing dateJan 19, 2005
Grant dateMar 10, 2009
Priority date
Expiry dateApr 12, 2027

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A position indicator comprises: a first indicator pattern composed of a plurality of substantially identical first partial patterns periodically arranged in a direction of extension, and a second indicator pattern composed of a plurality of substantially identical second partial patterns periodically arranged in the direction of extension. The first partial patterns may extend, along a first line extending transversely to the direction of extension, and the second partial patterns may extend along a second line extending transversely to the first line and the direction of extension The first and second partial patterns may be each composed of plural sub-patterns disposed adjacent to one another in the direction of extension. The sub-patterns of each pair of sub-patterns of the respective partial pattern are different from each other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.