Position indicator, measuring apparatus and method of manufacturing a position indicator
US7502280B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Jan 19, 2005 |
| Grant date | Mar 10, 2009 |
| Priority date | — |
| Expiry date | Apr 12, 2027 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A position indicator comprises: a first indicator pattern composed of a plurality of substantially identical first partial patterns periodically arranged in a direction of extension, and a second indicator pattern composed of a plurality of substantially identical second partial patterns periodically arranged in the direction of extension. The first partial patterns may extend, along a first line extending transversely to the direction of extension, and the second partial patterns may extend along a second line extending transversely to the first line and the direction of extension The first and second partial patterns may be each composed of plural sub-patterns disposed adjacent to one another in the direction of extension. The sub-patterns of each pair of sub-patterns of the respective partial pattern are different from each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.