Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices
US7502326B2 · kind B2 · utility
9Cited by
32References
12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 30, 2002 |
| Grant date | Mar 10, 2009 |
| Priority date | — |
| Expiry date | May 21, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method performs automated at-speed testing of devices. The method includes the steps of generating multiplexer control signals, forming various signal paths between a set of multiplexers and the devices based on the multiplexer control signals, and routing test signals having multiple gigabit per second (MGBPS) baud rates through the signal paths.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.