Method and apparatus for time-of-flight mass spectrometry
US7504620B2 · kind B2 · utility
28Cited by
3References
9Claims
0Family size
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Key dates
| Filing date | May 17, 2005 |
| Grant date | Mar 17, 2009 |
| Priority date | — |
| Expiry date | Apr 3, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/408
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.